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Join us for a workshop on Standards for Pathogen Detection via Next-Generation Sequencing, on Oct. 27-28, 2015. The purpose of this workshop is to seek input on defining reference materials, reference data and reference methods for assessing analytical sensitivity, specificity, and relative performance of NGS-based pathogen detection devices/assays.
This workshop will be targeted towards the primary users/adopters of these standards; including clinicians, the biosecurity community, public health labs, industry, academics and government laboratories.
Standards for Pathogen Detection via Next-Generation Sequencing
The purpose of this workshop is to seek input on defining reference materials, reference data and reference methods for assessing analytical sensitivity, specificity, and relative performance of NGS-based pathogen detection devices/assays.
Description: This workshop will be targeted towards the primary users/adopters of these standards; including clinicians, the biosecurity community, public health labs, industry, academics and government laboratories.
Day 1 (Oct. 27) Will Include Talks From Subject Matter Experts on Topics Including:
Day 2 (Oct. 28) Will Include Break-Out Sessions Focused On:
Poster Session for Industry Representatives
Day two (Oct. 28th) will also include a 2 hour poster session specifically for industry representatives to demonstrate their latest technological advances for pathogen detection.
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. When registration is open, the required NIST-1260 form will be available as well. *New Visitor Access Requirement: Effective July 21, 2014, Under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver’s license or identification card for access to federal facilities if issued by states that are REAL ID compliant or have an extension. Driver’s licenses from nine states and territories are not compliant and will not be accepted as identification. Click here for a list of alternative identification and further details>>
Workshop Announcement Please visit this page for more details.
Charles Chiu MD/PhD – UCSF School of Medicine
Joseph Campos PhD – Children's National Health System
John Besser PhD – CDC
Timothy Minogue PhD – USA MRIID Diagnostic Systems
Start Date: Tuesday, October 27, 2015
End Date: Wednesday, October 28, 2015
Location: NIST, 100 Bureau Drive, Gaithersburg, MD 20899
Audience: Industry, Government, Academia
Registration closes on 10/20/2015. All attendees must be pre-registered to gain entry to the NIST campus. Photo identification must be presented at the main gate to be admitted to the conference. International attendees are required to present a passport. Attendees must wear their conference badge at all times while on the campus. There is no on-site registration for meetings held at NIST.
Jami Schwartz, 301-975-8758